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SEM investigations were carried out on the lead sulfide thin film substrates, after the deposition of two combinations of the three- layers antireflection coatings, separately. The representative micrographs are shown in Figure 4. The general morphology of the coatings appeared comparable to each other, however, the grain boundaries of MgF2-SnO2-ZnSe coating were discernable and uniformly present throughout the specimen. At higher magnification, these boundaries were accompanied by mud cracking type features, which attributed to excessive shrinkage. Whereas, the MgF2-SiO-ZnSe coating was free from such types of cracking.
In the present case, where surface cracks were found in MgF2-SnO2-ZnSe; the primary factor of the cracking could be the intrinsic stresses generated due to microstructural mismatch between the subsequent layers. However, the precise identification and determination of the stress values are beyond the scope of the work undertaken and might be carried out in a separate study. Nevertheless, the presence of surface cracks in the coating may result in spalling and degradation of antireflection characteristics by subsequent moisture absorption.
Figure 5 shows the superimposed experimental reflection spectra of the coatings. The experimental reflection of the lead sulfide is higher than the theoretical values and it also accompanies profile variations, which are more pronounced at higher wavelengths i.e., beyond 1850 nm. These variations in the reflection and profile could be due to the surface defects, surface morphology, and the film discontinuities. Similarly, the reflections of three-layer antireflection coatings followed the profile of the uncoated lead sulfide, however an appreciable decrease in reflection occurred after the coating i.e., 30%. In comparison, the antireflection coating of combination-I, where the sandwich layer is SiO, the overall reflection profile is lower than the combination-II (with SnO2 as a sandwich layer). It could be due to the surface cracks in the combination-II coating, which may absorbed the moisture from the environment and caused a higher degree of the reflection, besides scattering of the incident radiations.
In the case of MgF2-SnO2-ZnSe coating, the deviation between theoretical and experimental spectra was even at higher side i.e. 6% in 1500 to 1800 nm region and 16% in 1800 to 2400 nm region. The higher deviation of the experimental results from theoretical values could be due to the higher density of defects and cracks in the film, which in turn absorbs more moisture from the environment, hence influences the reflectance of the film. 2ff7e9595c
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